2 results
Imaging of Defect Rich Heterogeneous Interfaces using Compressive Sensing STEM
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2488-2489
- Print publication:
- August 2022
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- Article
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Spatial Distribution of the Electron Dose and the Effects on Beam Damage in STEM
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2138-2140
- Print publication:
- August 2022
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- Article
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- You have access
- Export citation